Generic Processes & Materials - Workplan 2020
Version 1.0
- Materials:
- addition of new materials to the list of UV transparent
- for very low-energy photoelectric-effect
- add/update interfaces allowing use NIST parameters for custom element/materials
- Geometry Biasing with Importance:
- Comparison between generic and importance biasing
- Investigate rare crashes in Geometry-based Importance biasing
- Implement extension for multiple particle-type biasing.
- Differential Cross-section class:
- Design and implementation of at least an elastic diff. cross-section class to be used in DXTRAN option
- Make use of this class in some processes
- In particular the hadron elastic one
- Generic Biasing:
- Continue enriching event biasing options:
- DXTRAN-like biasing
- Implicit capture
- Occurrence biasing of charged particles, with cross-section changing over the step
- Extend generic biasing scheme for at rest case
- Statistical test suite to verify correctness of biasing wrt to analog
- Feasibility studies and prototyping
- Investigate use of occurrence biasing to allow continuous
density change inside a same volume
- point-like interactions solved at principle level
- what about continuous ?
- Material/isotope biasing
- Woodcock tracking
- Investigate use of occurrence biasing to allow continuous
density change inside a same volume
- Large cross-section change (eg : neutrino interaction)
- Fast Simulation:
- Continuation of GFlash models revision
- Modernisation of EM shower parametrisation
- including automated tuning procedures
- Investigate possibility of facilitators for machine learning inference
- Radiotherapy & radioprotection:
- Completion of the ambient dose equivalent H*(10) topics